Phabrix PHQXO-SDI-STRESS Advanced 12G-SDI Stress Testing Toolset (requires PHQX01E-3G / PHQXO-UHD and PHQXO-GEN)

ITEM #: PHQXO-SDI-STRESS MFG #: PHQXO-SDI-STRESS

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This item is custom made. Ordering this product requires written authorization. Please contact a sales engineer at 1-800-522-2025 for details.

Availability: Ships Factory Direct, Typically in 3-10 Business Days
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PHQXO-SDI-STRESS - Overview

The advanced SDI-STRESS option is available for stress testing and R&D evaluations of SDI interfaces up to 12G. A comprehensive API is included for rapid automation testing. The option includes the ability under automation control to insert up to 128UI peak to peak SDI clock jitter from 10Hz to 10MHz, mute any of the SDI outputs, and control the SDI scrambler, sync-bit insertion, pre-emphasis, rise time and driver amplitude. The SDI-STRESS Eye amplitude measurement provides both Shorth Mean or Mode, with a histogram overlay and a user-defined window for the exploration of eye amplitude. Pseudo-Random Binary Sequence (PRBS) generation and analysis of PRBS-7, 9, 15, 23, 31 allows for deterministic measurement of link Bit Error Rates (BER).

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